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At the EERL
the following equipment can be found:
Other equipment that we use:
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A general purpose JOEL-2300 scanning electron microscope (SEM) with
a Link energy dispersive x-ray (EDX) analysis system for elemental
identification is available at the Physics
and Astronomy Department.
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A VG Clam-2 X-ray photoelectron spectrometer (XPS) is available at
the Physics and Astronomy Department.
Dr. David Ingram from the Physics and Astronomy Department is
collaborating with the EERL on the characterization of the electrodes.
He allows our group to have access to XPS.
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An X-ray diffraction system (XRD) is available in the Physics and
Astronomy Department.
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An AA/AE Perkin Elmer Spectrophometer is available in the Civil Engineering
Department.
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A Dektak surface Profilometer is available in the Materials Research
Laboratory (Chemical Engineering Department). Dr.
Daniel Gulino collaborates with the EERL allowing the usage of
this equipment.
Other facilities are available in the materials lab (e.g., ovens, press,
microscope, etc)
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